Abstract
- On behalf of the Organizing Committee, we wish to welcome you to the 2024 IEEE International Conference onMetrology for eXtended Reality, Artificial Intelligence, and Neural Engineering (IEEE MetroXRAINE 2024). MetroXRAINE 2024 promotes synergies among experts in emerging technologies highly influencing frontierapplications: eXtended Reality, Brain-Computer Interface, and Artificial Intelligence, with special attention to themeasurement and its quality on the field (applied metrology).