Transient ablation topography of a thin chromium film after ultrashort pulsed laser irradiation in the spallation and phase explosion regime

Time-resolved imaging pump–probe reflectometry is an established technique to characterize the dynamic processes occurring during the material ablation upon ultrashort pulsed laser irradiation. In the phase explosion regime, however, the presence of an expanding liquid–vapor mixture on top of the ablated material makes an unambiguous determination of the transient ablation topography almost impossible, especially when only front-side pump–probe reflectometry is used. To circumvent this limitation, the front-side reflectometry was complemented by rear-side reflectometry, where the probe radiation does not interact with the liquid–vapor mixture, and the underneath ablation kinetics of the material becomes observable. To interpret the measured front- and rear-side reflectances, an optical multilayer model of the ablation process was developed. Its applicability is demonstrated on a thin chromium film that was ablated by a single pump pulse. The optical model replicates the Newton rings measured during spallation and phase explosion very well, which allows the reconstruction of the transient ablation topography. The combination of the front- and rear-side reflectometry with modeling offers a valuable tool for studying the ablation processes in thin metal films, because it overcomes the challenges of the phase explosion regime, and thus enhances the understanding of material dynamics upon laser irradiation.

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